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Indeed.

This is all very neat, but it appears these folks haven't heard of X-ray microscopy - I don't see why, with a sufficiently high resolution scan, you couldn't see the physical state of the NAND switches on the chip, without opening the packaging, or doing anything else to trigger it.

16nm gates, 10nm resolution achieved - this is probably "good enough", although would require some work as the resolution is barely better than the NAND cell size.

Although you could remedy this by wrapping the thing in lead, within the case - which maybe they have. Be interesting to see the RoHS statement.

http://en.wikipedia.org/wiki/X-ray_microscope

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